Advanced Scanning Electron Microscopy and X-Ray Microanalysis - Softcover
This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course.
"synopsis" may belong to another edition of this title.
- PublisherSpringer
- Publication date2013
- ISBN 10 1475790295
- ISBN 13 9781475790290
- BindingPaperback
- Number of pages466
Buy New
Learn more about this copy
US$ 111.54
Shipping:
FREE
Within U.S.A.
Top Search Results from the AbeBooks Marketplace
Seller Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis by Echlin, Patrick, Fiori, C.E., Goldstein, Joseph, Joy, David C., Newbury, Dale E. [Paperback ]
Seller:
Rating
Book Description Soft Cover. Condition: new. Seller Inventory # 9781475790290
Buy New
US$ 111.54
Convert currency
Seller Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Seller:
Rating
Book Description Condition: New. Seller Inventory # 20390175-n
Buy New
US$ 117.98
Convert currency
Stock Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by
Springer
(2013)
ISBN 10: 1475790295
ISBN 13: 9781475790290
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # ABLIING23Mar2716030094524
Buy New
US$ 116.64
Convert currency
Stock Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Seller:
Rating
Book Description Condition: New. Buy with confidence! Book is in new, never-used condition 1.45. Seller Inventory # bk1475790295xvz189zvxnew
Buy New
US$ 135.66
Convert currency
Stock Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Seller:
Rating
Book Description Condition: New. New! This book is in the same immaculate condition as when it was published 1.45. Seller Inventory # 353-1475790295-new
Buy New
US$ 135.66
Convert currency
Stock Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by
Springer
(2013)
ISBN 10: 1475790295
ISBN 13: 9781475790290
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. PRINT ON DEMAND Book; New; Fast Shipping from the UK. No. book. Seller Inventory # ria9781475790290_lsuk
Buy New
US$ 123.01
Convert currency
Seller Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by
Springer US Jun 2013
(2013)
ISBN 10: 1475790295
ISBN 13: 9781475790290
New
Taschenbuch
Quantity: 2
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. This item is printed on demand - it takes 3-4 days longer - Neuware -This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. 476 pp. Englisch. Seller Inventory # 9781475790290
Buy New
US$ 125.67
Convert currency
Seller Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by
Springer US
(2013)
ISBN 10: 1475790295
ISBN 13: 9781475790290
New
Softcover
Quantity: > 20
Seller:
Rating
Book Description Condition: New. Seller Inventory # 4208375
Buy New
US$ 103.22
Convert currency
Stock Image
Advanced Scanning Electron Microscopy and X-ray Microanalysis
Published by
Springer Verlag
(2013)
ISBN 10: 1475790295
ISBN 13: 9781475790290
New
Paperback
Quantity: 2
Seller:
Rating
Book Description Paperback. Condition: Brand New. reprint edition. 466 pages. 8.75x6.00x0.75 inches. In Stock. Seller Inventory # x-1475790295
Buy New
US$ 148.77
Convert currency
Seller Image
Advanced Scanning Electron Microscopy and X-Ray Microanalysis
Published by
Springer US
(2013)
ISBN 10: 1475790295
ISBN 13: 9781475790290
New
Taschenbuch
Quantity: 1
Seller:
Rating
Book Description Taschenbuch. Condition: Neu. Druck auf Anfrage Neuware - Printed after ordering - This book has its origins in the intensive short courses on scanning elec tron microscopy and x-ray microanalysis which have been taught annually at Lehigh University since 1972. In order to provide a textbook containing the materials presented in the original course, the lecturers collaborated to write the book Practical Scanning Electron Microscopy (PSEM), which was published by Plenum Press in 1975. The course con tinued to evolve and expand in the ensuing years, until the volume of material to be covered necessitated the development of separate intro ductory and advanced courses. In 1981 the lecturers undertook the project of rewriting the original textbook, producing the volume Scan ning Electron Microscopy and X-Ray Microanalysis (SEMXM). This vol ume contained substantial expansions of the treatment of such basic material as electron optics, image formation, energy-dispersive x-ray spectrometry, and qualitative and quantitative analysis. At the same time, a number of chapters, which had been included in the PSEM vol ume, including those on magnetic contrast and electron channeling con trast, had to be dropped for reasons of space. Moreover, these topics had naturally evolved into the basis of the advanced course. In addition, the evolution of the SEM and microanalysis fields had resulted in the devel opment of new topics, such as digital image processing, which by their nature became topics in the advanced course. Seller Inventory # 9781475790290
Buy New
US$ 127.40
Convert currency